High Performance Table Top SIMS – MiniSIMS

MiniSIMS-ToF


The MiniSIMS ToF  has a superior level of performance for probing the unknown, investigating smaller surface features and extracting more information from organic samples. The implementation of a time-of flight (ToF) mass spectrometer therefore takes the MiniSIMS concept to a new level of performance by providing spot analysis, imaging, and depth profiling in one compact, easy to use package. The hyperspectral imaging capability of the MiniSIMS-ToF combined with efficient depth profiling allow complete 3D spatial pixel arrays with full or partial mass spectra at every pixel to be acquired. In this way a very comprehensive picture of the surface and sub surface chemistry of solid samples can be acquired with minimal setup and analyzed retrospectively.

  • Pulsing of secondary ions as opposed to the primary beam result in more rapid can complete analysis
  • Standard Ga emitter with option for other emitters
  • Easy to operate software and rapid pump down
  • Auxiliary electron gun can be fitted to extend analysis to insulating samples.
  • Fully automated and simple operation
  • For larger or multiple samples, the enhanced sample stage can accommodate a 31 position carousel for programmed data acquisition or a single sample can be inserted up to 100 mm diameter
  • ToF mass analyzer with mass range up to 1200 amu
  • Able to obtain full range mass spectra for both positive and negative secondary ion polarities within the static SIMS limit.

MiniSIMS

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MiniSIMS-Alpha


The MiniSIMS Alpha is a cost effective instrument in research or process optimization, for fast analysis of a specific surface property or repetitive analysis of multiple samples. This high-throughput instrument is ideal for situations where a specific aspect of the sample is to be investigated. It is a highly effective method for monitoring quality by assessment against a known standard, or for comparative analysis of many samples in research or process optimization. In such situations, pre-set analysis conditions mean that reproducible data can be acquired by many different operators. Typical analysis times are as short as five minutes per sample. The MiniSIMS Alpha is designed to allow surface, imaging and depth profiling modes of operation in one instrument.

  • Optional auxiliary electron gun can be fitted to extend analysis to insulating samples.
  • Fully automated and simple operation
  • For larger or multiple samples, the enhanced sample stage can accommodate a 31 position carousel for programmed data acquisition or a single sample can be inserted up to 100 mm diameter
  • Quadrupole mass analyzer with mass range 300 Da and unit mass resolution
  • Able to obtain full range mass spectra for both positive and negative secondary ion polarities within the static SIMS limit.

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